Jixiang Hou

Title: Jixiang Hou: Innovator in Memory Testing Technology

Introduction

Jixiang Hou is a prominent inventor based in Beijing, China. He has made significant contributions to the field of memory testing technology. His innovative approach has led to the development of a unique patent that enhances the efficiency of memory sequential tests.

Latest Patents

Jixiang Hou holds a patent for a method titled "Scan chain for memory sequential test." This invention involves constructing a scan chain for memory sequential testing. The method includes determining an input boundary register of the memory and calculating the number of test vectors required based on the type of memory input pins connected to the input boundary register. The arrangement of the scan chain is based on this number, ensuring that there are at least (N-1) continuous non-boundary registers adjacent to the input boundary register. Additionally, control signals are set for the input boundary register and the non-boundary registers to receive scan test input as test vectors under memory sequential test mode. This patent showcases his expertise in optimizing memory testing processes.

Career Highlights

Jixiang Hou is currently employed at International Business Machines Corporation (IBM). His work at IBM has allowed him to collaborate with other talented professionals in the field. His contributions have been instrumental in advancing memory testing technologies.

Collaborations

Some of Jixiang Hou's notable coworkers include Hailong Li and Li Liu. Their collaborative efforts have further enhanced the innovative projects they work on together.

Conclusion

Jixiang Hou is a distinguished inventor whose work in memory testing technology has made a significant impact. His patent demonstrates his commitment to innovation and excellence in the field. His contributions continue to shape the future of memory testing methodologies.