Linjun Cao

Title: Linjun Cao: Innovator in Integrated Circuit Testing

Introduction

Linjun Cao is a notable inventor based in Ballston Lake, NY (US). He has made significant contributions to the field of integrated circuit testing, showcasing his expertise through his innovative patent.

Latest Patents

Linjun Cao holds a patent for a "Parallel test structure." This exemplary apparatus includes a testing module that connects to an integrated circuit containing devices under test. The testing module performs a time-dependent dielectric breakdown (TDDB) test on these devices. A decoder is integrated into the system, selectively connecting each device being tested to the testing module. Additionally, efuses are connected to different devices under test, allowing for separate electrical disconnection upon failure. Protection circuits are also included, providing a shunt around the decoder in case of device failure.

Career Highlights

Linjun Cao is currently employed at GlobalFoundries Inc., where he continues to develop and refine testing methodologies for integrated circuits. His work has been instrumental in enhancing the reliability and performance of electronic devices.

Collaborations

Linjun collaborates with talented coworkers such as Tian Shen and Anil Kumar, contributing to a dynamic and innovative work environment.

Conclusion

Linjun Cao's contributions to integrated circuit testing through his patent and work at GlobalFoundries Inc. highlight his role as a key innovator in the field. His advancements are paving the way for improved electronic device reliability and performance.