Santa Clara, CA, United States of America

Lingfei Meng

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Mura Inc.. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Lingfei Meng. Retrieved from https://idiyas.com/inventor/lingfei-meng-4td0vj4h

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: Innovations by Lingfei Meng in 3D Surface Measurement Technology.

Introduction

Lingfei Meng is an accomplished inventor based in Santa Clara, CA. He has made significant contributions to the field of 3D surface measurement technology. His innovative work focuses on systems and methods that enhance the accuracy and efficiency of surface measurements.

Latest Patents

Lingfei Meng holds a patent for "Systems and methods for 3D surface measurements." This patent describes certain embodiments directed to 3D surface measurement systems and methods. These systems are designed to direct engineered illumination of beams in one or more ray bundles to multiple illumination directions incident on a sample surface. The technology enables the measurement of a map of surface normals, a depth map, and a map of surface properties using intensity images captured while the engineered illumination is directed to the sample surface. He has 1 patent to his name.

Career Highlights

Lingfei Meng is currently employed at Mura Inc., where he continues to develop innovative solutions in his field. His work at Mura Inc. reflects his commitment to advancing technology in 3D surface measurements.

Collaborations

Lingfei collaborates with Jun Jiang, a fellow innovator in the industry. Their partnership enhances the development of cutting-edge technologies in their respective fields.

Conclusion

Lingfei Meng's contributions to 3D surface measurement technology demonstrate his expertise and innovative spirit. His patent and ongoing work at Mura Inc. highlight the importance of advancements in this area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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