The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 2019
Filed:
Jul. 20, 2017
Applicant:
Mura Inc., San Jose, CA (US);
Inventors:
Lingfei Meng, Santa Clara, CA (US);
Jun Jiang, Santa Clara, CA (US);
Assignee:
Mura Inc., San Jose, CA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/25 (2006.01); H04N 13/20 (2018.01); G01B 11/30 (2006.01); H04N 13/271 (2018.01); H04N 13/296 (2018.01);
U.S. Cl.
CPC ...
G01B 11/25 (2013.01); G01B 11/303 (2013.01); H04N 13/271 (2018.05); H04N 13/296 (2018.05);
Abstract
Certain embodiments are directed to 3D surface measurement systems and methods configured to direct engineered illumination of beams in one or more ray bundles to N illumination directions incident a sample surface. The systems and methods can measure a map of surface normals, a depth map, and a map of surface properties using intensity images captured while the engineered illumination is directed to the sample surface.