Cambridge, MA, United States of America

Ling Xie

This inventor holds 1 USPTO granted patent. Top assignee: Harvard College. Active years: 2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ling Xie. Retrieved from https://idiyas.com/inventor/ling-xie-uinr6ea8

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2023

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1 patent (USPTO):Explore Patents

Title: Ling Xie: Innovator in Atomic-Scale Probes

Introduction

Ling Xie is a prominent inventor based in Cambridge, MA (US). She has made significant contributions to the field of nanotechnology, particularly in the development of atomic-scale probes. Her innovative work has led to advancements in various applications, including materials science and quantum computing.

Latest Patents

Ling Xie holds a patent for a "Diamond probe hosting an atomic sized defect." This patent describes a method of manufacturing, characterizing, and mounting a probe that includes a pillar with a taper angle and at least one engineered defect. The taper angle can be formed using crystallographic or etching-based techniques. Additionally, the probe is designed to be mounted to an AFM chip, with an RF waveguide connected to provide RF excitation.

Career Highlights

Ling Xie is affiliated with Harvard College, where she continues her research and development in the field of nanotechnology. Her work has garnered attention for its potential applications in various scientific and engineering disciplines.

Collaborations

Ling collaborates with notable colleagues, including Xu Zhou and Rainer Joachim Stohr, who contribute to her research endeavors.

Conclusion

Ling Xie's innovative contributions to atomic-scale probes exemplify her commitment to advancing technology in nanotechnology. Her work continues to inspire future developments in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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