The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 28, 2023
Filed:
Mar. 13, 2018
Applicant:
President and Fellows of Harvard College, Cambridge, MA (US);
Inventors:
Xu Zhou, Cambridge, MA (US);
Rainer Joachim Stohr, Stuttgart, DE;
Ling Xie, Cambridge, MA (US);
Amir Yacoby, Cambridge, MA (US);
Assignee:
President and Fellows of Harvard College, Cambridge, MA (US);
Primary Examiner:
Int. Cl.
CPC ...
G01Q 70/14 (2010.01); G01Q 60/38 (2010.01);
U.S. Cl.
CPC ...
G01Q 70/14 (2013.01); G01Q 60/38 (2013.01);
Abstract
A method of manufacturing, characterizing, mounting, and a system of a probe may include a pillar having a taper angle and at least one engineered defect. The taper angle may be formed using crystallographic- or etching-based techniques. The probe may be mounted to an AFM chip. Furthermore, an RF waveguide may be connected to the AFM chip for providing RF excitation.