Singapore, Singapore

Lin Wei Zheng

This inventor holds 1 USPTO granted patent. Top assignee: Asm Technology Singapore Pte Ltd. Active years: 2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Lin Wei Zheng. Retrieved from https://idiyas.com/inventor/lin-wei-zheng

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2018

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1 patent (USPTO):Explore Patents

Title: Lin Wei Zheng: Innovator in Wire Bond Testing Technology

Introduction

Lin Wei Zheng is a notable inventor based in Singapore, recognized for his contributions to the field of wire bond testing technology. With a focus on enhancing the reliability of electronic components, Zheng has developed innovative methods that streamline the testing process.

Latest Patents

Zheng holds a patent for a "Method and system for pull testing of wire bonds." This invention outlines a systematic approach for testing the integrity of wire bonds. The method includes several steps: bonding a wire to a conductive surface, clamping the wire, applying a predetermined pulling force, detecting the status of the electrical circuit, and determining bond failure if the circuit is open. This patent represents a significant advancement in ensuring the quality and reliability of electronic connections.

Career Highlights

Lin Wei Zheng is currently employed at Asm Technology Singapore Pte Ltd, where he applies his expertise in wire bonding technology. His work contributes to the development of high-quality electronic components that are essential in various industries.

Collaborations

Zheng collaborates with talented colleagues, including Qing Le Tan and Yi Bin Wang, to further enhance the innovations in their field. Their teamwork fosters an environment of creativity and technical advancement.

Conclusion

Lin Wei Zheng's innovative approach to wire bond testing exemplifies the importance of reliability in electronic manufacturing. His contributions continue to impact the industry positively, ensuring that electronic components meet high standards of quality.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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