This inventor holds 1 USPTO granted patent. Top assignees: Beijing Waiteksin Advanced Technology Co., Ltd., Capital Normal University, Chongqing Normal University. Active years: 2016.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
1 out of 1 
1 out of 9 
1 out of 1 Years Active: 2016
Title: The Innovative Contributions of Lichun Feng in Measurement Technology
Introduction: Lichun Feng, an inventor based in Beijing, China, has made significant strides in the field of measurement technology. With a patent to his name, Feng's innovative approach showcases a blend of practical application and advanced technology, contributing to the efficiency of measuring thickness and defect depth in various materials.
Latest Patents: Feng's notable patent is titled "Method for measuring thickness by pulsed infrared thermal wave technology." This groundbreaking method involves heating the measured object using pulsed heating devices while simultaneously capturing a sequence of thermal images on its surface through an infrared thermography device. The thermal image sequence is stored in general-purpose memory, allowing for meticulous analysis. The innovation further enhances measurement accuracy by utilizing a unique process of multiplying the temperature-time curve at every point in the thermal image sequence to derive a new curve. Through calculating first-order differentials and determining peak times, the method successfully calculates the thickness or defect depth of the measured object.
Career Highlights: Throughout his career, Lichun Feng has been associated with esteemed institutions such as Capital Normal University and Beijing Waiteksin Advanced Technology Co., Ltd. His work at these organizations not only reflects his technical expertise but also highlights his dedication to advancing measurement technologies.
Collaborations: Feng has collaborated with various professionals, including coworkers Zhi Zeng and Xun Wang. Together, they have contributed to the development of innovative methodologies and techniques in their respective fields.
Conclusion: Lichun Feng stands out as a prominent figure in the world of measurement technology with his inventive method for thickness measurement using pulsed infrared thermal wave technology. His contributions have the potential to influence various industries, paving the way for more accurate and efficient measurement techniques in the future.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile