Shanghai, China

Liangqing Zhu

This inventor holds 1 USPTO granted patent. Top assignee: East China Normal University. Active years: 2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Liangqing Zhu. Retrieved from https://idiyas.com/inventor/liangqing-zhu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2023

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1 patent (USPTO):Explore Patents

Title: The Innovations of Liangqing Zhu

Introduction

Liangqing Zhu is a prominent inventor based in Shanghai, China. He has made significant contributions to the field of semiconductor materials and devices. His work focuses on enhancing the understanding of photoelectric performance under various conditions.

Latest Patents

Liangqing Zhu holds a patent for an "Automatic Photocurrent Spectrum Measurement System Based on Fourier Infrared Spectrometer." This innovative system includes a light source component, an environment control component, a measuring module, and a control module. It is designed to evaluate the photoelectric performance of semiconductor materials or devices under different temperatures, voltage biases, or current biases. He has 1 patent to his name.

Career Highlights

Liangqing Zhu is affiliated with East China Normal University, where he contributes to research and development in his field. His expertise in semiconductor technology has positioned him as a valuable asset in academic and research circles.

Collaborations

Liangqing Zhu has collaborated with notable colleagues, including Liyan Shang and Zhigao Hu. Their combined efforts have further advanced research in semiconductor materials.

Conclusion

Liangqing Zhu's innovative work in the field of semiconductor technology exemplifies the impact of dedicated research and development. His contributions continue to influence advancements in photoelectric performance evaluation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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