The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 26, 2023
Filed:
Aug. 02, 2022
Applicant:
East China Normal University, Shanghai, CN;
Inventors:
Liangqing Zhu, Shanghai, CN;
Junli Wang, Shanghai, CN;
Liyan Shang, Shanghai, CN;
Le Wang, Shanghai, CN;
Zhigao Hu, Shanghai, CN;
Assignee:
East China Normal University, Shanghai, CN;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/35 (2014.01); G01N 21/3563 (2014.01); G01N 21/01 (2006.01);
U.S. Cl.
CPC ...
G01N 21/3563 (2013.01); G01N 21/01 (2013.01); G01N 2021/3595 (2013.01); G01N 2201/023 (2013.01);
Abstract
An automatic photocurrent spectrum measurement system based on a Fourier infrared spectrometer, including a light source component, an environment control component, a measuring module, and a control module. The system is configured to evaluate photoelectric performance semiconductor materials or devices under different temperatures, voltage biases or current biases.
Zhu, Liangqing. (2023). Automatic photocurrent spectrum measurement system based on fourier infrared spectrometer (U.S. Patent No. 11852582). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11852582
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile