This inventor holds 2 USPTO granted patents. Top assignees: Oracle America, Inc., Sun Microsystems, Inc.. Active years: 2009-2012.
Company Filing History:
Years Active: 2009-2012
Title: Innovations of Liang-Chi Chen
Introduction
Liang-Chi Chen is a notable inventor based in Cupertino, CA. He has made significant contributions to the field of circuit design and testing, holding a total of 2 patents. His work focuses on improving the reliability and efficiency of integrated circuits.
Latest Patents
One of his latest patents is a technique for determining circuit interdependencies. This invention describes a device, method, and computer-program product for statistically characterizing interdependencies between sub-circuits in an integrated circuit. The system identifies 'aggressor-victim relationships' by analyzing performance metrics, such as clock speed, when the integrated circuit fails. This statistical analysis allows for the selection of a worst-case sub-group of state-change difference vectors, which can be used for accurate testing of the integrated circuit.
Another significant patent is a method and system for automated path delay test vector generation from functional tests. This invention provides methods for generating test vectors that enhance the verification of circuit designs and hardware testing. The system can systematically perform functional and structural testing on selected paths of the circuit design, generating test vectors that increase path delay test coverage.
Career Highlights
Liang-Chi Chen has worked with prominent companies in the tech industry, including Sun Microsystems, Inc. and Oracle America, Inc. His experience in these organizations has contributed to his expertise in circuit design and testing.
Collaborations
Throughout his career, Liang-Chi Chen has collaborated with notable professionals, including Daniel R. Watkins and Paul J. Dickinson. These collaborations have further enriched his work and innovations in the field.
Conclusion
Liang-Chi Chen's contributions to circuit design and testing through his patents demonstrate his commitment to advancing technology. His work continues to influence the industry and improve the reliability of integrated circuits.