The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 17, 2012
Filed:
Apr. 29, 2009
Paul J. Dickinson, San Jose, CA (US);
Venkatesh P. Gopinath, Fremont, CA (US);
Karl P. Dahlgren, Fremont, CA (US);
Liang-chi Chen, Cupertino, CA (US);
Paul J. Dickinson, San Jose, CA (US);
Venkatesh P. Gopinath, Fremont, CA (US);
Karl P. Dahlgren, Fremont, CA (US);
Liang-Chi Chen, Cupertino, CA (US);
Oracle America, Inc., Redwood Shores, CA (US);
Abstract
Embodiments of a device (such as a computer system or a circuit tester), a method, and a computer-program product (i.e., software) for use with the device are described. These systems and processes may be used to statistically characterize interdependencies between sub-circuits in an integrated circuit (which are referred to as 'aggressor-victim relationships'). In particular, statistical relationships between the aggressors and victims are determined from values of a performance metric (such as clock speed) when the integrated circuit fails for a group of state-change difference vectors. Using these statistical relationships, a worst-case sub-group of the state-change difference vectors, such as the worst-case sub-group, is selected. This sub-group can be used to accurately test the integrated circuit.