This inventor holds 1 USPTO granted patent. Top assignee: General Electric Company. Active years: 2007.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2007
Title: The Innovations of Li Wen in CT Detector Technology
Introduction
Li Wen is an accomplished inventor based in Clifton Park, NY (US). She has made significant contributions to the field of medical imaging technology, particularly in the development of CT detectors. Her innovative work has led to the creation of a patent that enhances the diagnostic capabilities of CT imaging.
Latest Patents
Li Wen holds a patent for a "CT detector having an optical mask layer." This invention involves an optical mask layer that is strategically placed between the photodiode array and scintillator array of a CT detector. The optical mask layer is designed to absorb and/or reflect light emitted from the scintillators of the scintillator array. By doing so, it reduces the transference of light photons from one scintillator to a neighboring photodiode. This reduction in cross-talk minimizes artifacts in reconstructed images, thereby improving their diagnostic value.
Career Highlights
Li Wen is currently employed at General Electric Company, where she continues to innovate in the field of medical imaging. Her work has not only advanced technology but has also contributed to better patient outcomes through improved imaging techniques.
Collaborations
Li Wen collaborates with talented professionals in her field, including Abdelaziz Ikhlef and Gregory Scott Zeman. These collaborations enhance the research and development efforts at General Electric Company.
Conclusion
Li Wen's contributions to CT detector technology exemplify the impact of innovation in medical imaging. Her patent for an optical mask layer is a testament to her dedication to improving diagnostic imaging. Through her work, she continues to pave the way for advancements in healthcare technology.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
