The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 19, 2007

Filed:

Dec. 11, 2003
Applicants:

Abdelaziz Ikhlef, Waukesha, WI (US);

Gregory S. Zeman, Waukesha, WI (US);

George E. Possin, Niskayuna, NY (US);

LI Wen, Clifton Park, NY (US);

Inventors:

Abdelaziz Ikhlef, Waukesha, WI (US);

Gregory S. Zeman, Waukesha, WI (US);

George E. Possin, Niskayuna, NY (US);

Li Wen, Clifton Park, NY (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/03 (2006.01); G01T 1/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical mask layer for a CT detector is disclosed and is disposed between the photodiode array and scintillator array of a CT detector. The optical mask layer, which may extend along the x-axis, z-axis, or both, is designed to absorb and/or reflect light emitted the scintillators of the scintillator array. Through this absorption and/or reflection, transference of light photons from a scintillator to the photodiode corresponding to a neighboring scintillator is reduced. This reduction in cross-talk reduces artifacts in a reconstructed image and therefore improves the diagnostic value of the image.


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