Li Juan Long

Title: Profile of Inventor Li Juan Long

Introduction: Li Juan Long is a prominent inventor based in Beijing, China. With a focus on improving web functionalities, she has made significant contributions through her innovative patent that addresses specific issues in website design and usability.

Latest Patents: Li Juan Long holds one notable patent titled "Detecting Truncation and Overlap Defects on Webpage." This computer-implemented method, system, and computer program product aims to identify truncation and overlap defects in webpage elements. The patent involves obtaining location and size information for these elements, performing an intersection over union (IoU) calculation, and determining the location relationships between these elements. By analyzing these facets, any defects can be marked on a screen capture, enhancing the overall user experience.

Career Highlights: Li Juan Long is currently associated with the International Business Machines Corporation (IBM), where her expertise in web development and defect detection plays a crucial role in delivering quality solutions. Her work not only demonstrates her skill in technology but also showcases her commitment to enhancing digital interfaces.

Collaborations: Throughout her career, Li Juan Long has worked alongside talented professionals such as Jin Zhang and Jun Fan. These collaborations have significantly contributed to her innovative endeavors, fostering an environment of shared knowledge and creativity within the team.

Conclusion: Li Juan Long's innovative patent and career achievements illustrate her valuable contributions to the field of technology. Her work at IBM and her collaborations with coworkers emphasize her ability to address complex challenges in web design. As a pioneer in detecting webpage defects, Li Juan Long continues to influence the future of web development.