The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 25, 2023
Filed:
Apr. 07, 2021
International Business Machines Corporation, Armonk, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A computer-implemented method, system and computer program product for detecting truncation and overlap defects. Location and size information for the elements of the webpage are obtained. An intersection over union (IoU) calculation is performed for two webpage elements using the obtained location and size information for at least one of these webpage elements. Furthermore, the location relationship between these two webpage elements is determined. A table, which defines truncation defect and overlap defect scenarios, is then reviewed to determine if there are any truncation or overlap defects in these two webpage elements using the IoU calculation, the location relationship and the text condition, which indicates whether text is included in one of the two webpage elements. If any truncation or overlap defects are found in the webpage, then such truncation and/or overlap defects are marked on a screen capture of the webpage.