Leon Van De Logt

Title: Leon Van De Logt and Single-Terminal Boundary Scan Testing.

Introduction

Leon Van De Logt is an inventor based in Son, the Netherlands. His listed patent concerns a method for carrying out boundary scan testing through a single electronic-circuit pin.

Latest Patents

Van De Logt is associated with one patent, titled “System and Method for Single Terminal Boundary Scan.” The invention describes an electronic circuit that receives an embedded-clock test signal through one pin. The signal encodes a bit stream containing headers and boundary scan mode and test-input bits. The circuit extracts the clock and bit stream, detects the headers, identifies and distributes the relevant bits, and performs the boundary scan test. This approach enables test information and timing to be conveyed through a single terminal.

Career Highlights

Van De Logt’s listed patent reflects work on electronic testing and boundary scan techniques. He is associated with NXP B.V., a company active in the semiconductor industry. The available information identifies one patent for him.

Collaborations

Henk Boezen and Liquan Fang are listed as Van De Logt’s coworkers. Their shared professional context is associated with NXP B.V.

Conclusion

Leon Van De Logt’s patent presents a single-terminal approach to boundary scan testing, combining encoded test data and clock information to support circuit testing.