The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 03, 2013

Filed:

Oct. 19, 2009
Applicants:

Henk Boezen, Nijmegen, NL;

Leon Van DE Logt, Son, NL;

Liquan Fang, Malden, NL;

Inventors:

Henk Boezen, Nijmegen, NL;

Leon Van de Logt, Son, NL;

Liquan Fang, Malden, NL;

Assignee:

NXP B.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/3177 (2006.01); G01R 31/40 (2006.01);
U.S. Cl.
CPC ...
Abstract

An electronic circuit having a boundary scan test circuit receives, though one pin, an embedded clock encoded test signal having an encoded bit stream having occurrences of a first header followed by at least one encoded boundary scan mode bit and an encoded second header followed by at least one boundary scan test input bit. The bit stream and the clock are extracted and occurrences of the first header and second header are detected. Based on the detected occurrences the boundary scan mode bits and boundary scan input bits are identified and distributed to the electronic circuit, along with the extracted clock, and boundary scan test is performed.


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