Leo N Altukoff

Title: Innovations by Leo N Altukoff

Introduction

Leo N Altukoff is an accomplished inventor based in Battle Ground, WA (US). He has made significant contributions to the field of visual measuring systems. His innovative approach has led to the development of a unique calibration method and device that enhances the accuracy of visual measurements.

Latest Patents

Altukoff holds a patent for a "Calibration method and device for visual measuring systems." This invention provides a calibration method and device for two-point cold calibration, suitable for any visual measuring system equipped with a width analyzer. Specifically, it is designed to calibrate a CCD camera in a visual measuring system that monitors the diameter of a crystal rod during the Czochralski process. The method effectively addresses non-linear errors and eliminates the need for actual crystal growth during calibration. The calibration device is engineered for quick and precise setup, making it a valuable tool in the industry.

Career Highlights

Leo N Altukoff is associated with Seh America, Inc., where he applies his expertise in visual measurement technologies. His work has been instrumental in advancing the capabilities of visual measuring systems, particularly in the context of crystal growth monitoring.

Collaborations

Throughout his career, Altukoff has collaborated with notable colleagues, including Mike W Mayer and Barton V White. These partnerships have contributed to the development and refinement of innovative technologies in the field.

Conclusion

In summary, Leo N Altukoff is a notable inventor whose work in calibration methods for visual measuring systems has made a significant impact. His patent reflects a commitment to innovation and precision in measurement technologies.