Bayside, NY, United States of America

Len Anderson

This inventor holds 1 USPTO granted patent. Top assignee: Zebra Technologies Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Len Anderson. Retrieved from https://idiyas.com/inventor/len-anderson-891f6max

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Len Anderson: Inventor in Health-Assessment Technology

Introduction

Len Anderson is an inventor based in Bayside, New York, and is associated with Zebra Technologies Corporation. His patent work addresses the assessment and recalibration of light-emission components in imaging systems.

Latest Patents

Anderson is credited with 1 patent: “System and Method of Calibrating Health of Off-Platter Detector Using Integrated Weigh Platter.” The invention describes assessing the health of a light-emission assembly and recalibrating it when needed. In an imaging system with a weigh platter and an off-platter detection assembly, the system first confirms that no object is present. It then uses a zero-weight reading from the platter to assess the detection assembly. If the assessment indicates that light intensity has degraded sufficiently, the system can recalibrate the assembly by measuring reflected light.

Career Highlights

Anderson’s listed patent connects imaging-system diagnostics with an integrated weigh platter. The approach uses the platter’s zero-weight condition to support health assessment of the off-platter detector and guide selective recalibration.

Collaborations

Anderson’s listed coworkers include Pavithra Eswaran and Joseph F. DiGregorio. His patent is associated with Zebra Technologies Corporation.

Conclusion

Len Anderson’s patent describes a method for assessing and recalibrating an imaging system’s off-platter detection assembly using information from an integrated weigh platter.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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