The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2026

Filed:

Jun. 07, 2024
Applicant:

Zebra Technologies Corporation, Lincolnshire, IL (US);

Inventors:

Pavithra Eswaran, Plainview, NY (US);

Joseph F. Digregorio, Seaford, NY (US);

Len Anderson, Bayside, NY (US);

Narendra Joshi, Lake Grove, NY (US);

Xianping Ren, Merrick, NY (US);

Assignee:

Zebra Technologies Corporation, Lincolnshire, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 7/00 (2006.01); G06K 7/10 (2006.01); H04N 23/20 (2023.01);
U.S. Cl.
CPC ...
G06K 7/0095 (2013.01); G06K 7/10841 (2013.01); H04N 23/20 (2023.01);
Abstract

Technologies for assessing a health condition of a light emission assembly and recalibrating the light emission assembly are disclosed. For example, health assessment and recalibration of an imaging system is performed by initially identifying absence of an object at the imaging system, before performing either the assessment or recalibration. For an imaging system having a weigh platter assembly and an off-platter detection assembly serving as the subject light emission assembly, the imaging system performs a health assessment of the detection assembly responsive to a zero weight condition measured at the platter assembly. The imaging system then selectively enters into recalibration, responsive to the health assessment finding a sufficiently degraded light intensity, by measuring reflected light from the detection assembly.


Find Patent Forward Citations

Eswaran, Pavithra. (2026). System and method of calibrating health of off-platter detector using integrated weigh platter (U.S. Patent No. 12762359). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12762359

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…