Dresden, Germany

Leif Riemenschneider

This inventor holds 1 USPTO granted patent. Top assignee: Nambition Gmbh. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Leif Riemenschneider. Retrieved from https://idiyas.com/inventor/leif-riemenschneider

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: Leif Riemenschneider: Innovator in Biological Systems Investigation

Introduction

Leif Riemenschneider is a notable inventor based in Dresden, Germany. He has made significant contributions to the field of biological systems and solid systems through his innovative patent. His work focuses on enhancing the capabilities of scanning probe microscopy and atomic force spectroscopy.

Latest Patents

Riemenschneider holds a patent titled "Apparatus and method for investigating biological systems and solid systems." This patent proposes a procedure for conducting measurements within predetermined parameters. The procedure includes determining a value variance of at least one parameter and controlling an adjustment member to compensate for this variance.

Career Highlights

Leif Riemenschneider is associated with Nambition GmbH, where he applies his expertise in developing advanced measurement techniques. His work has the potential to impact various scientific fields, particularly in understanding complex biological systems.

Collaborations

Riemenschneider collaborates with Gerd Hoffmann, contributing to the advancement of their shared research interests.

Conclusion

Leif Riemenschneider's innovative work in the field of biological systems investigation exemplifies the importance of patents in fostering scientific advancement. His contributions continue to influence research methodologies and enhance our understanding of complex systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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