The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2012
Filed:
Dec. 28, 2006
Applicants:
Leif Riemenschneider, Dresden, DE;
Gerd Hoffmann, Fuerth, DE;
Inventors:
Leif Riemenschneider, Dresden, DE;
Gerd Hoffmann, Fuerth, DE;
Assignee:
Nambition GmbH, Dresden, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/28 (2006.01);
U.S. Cl.
CPC ...
Abstract
Proposed is a procedure for carrying out a scanning probe microscopic or atomic force spectroscopic measurement within predetermined parameters, which said procedure encompasses the following steps: a determination of a value variance of at least one of the parameters, and control of an adjustment member in relation to said variance, so that the variance is at least partially compensated for.
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Riemenschneider, Leif. (2012). Apparatus and method for investigating biological systems and solid systems (U.S. Patent No. 8291511). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8291511
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile