Lee-Wen Hsu

Title: Lee-Wen Hsu: Innovator in Wafer Test Pad Technology

Introduction

Lee-Wen Hsu is a prominent inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of semiconductor technology, particularly in the development of wafer test pads. His innovative work has led to the filing of a patent that showcases his expertise and creativity in this specialized area.

Latest Patents

Lee-Wen Hsu holds a patent for a wafer test pad, which presents a redistribution structure. This structure includes a first dielectric layer, a mesh metal feature with a base portion and a frame portion, a second dielectric layer, a redistribution feature, and a passivation structure. The design also features a pad opening that exposes the top surface of the redistribution feature, which includes multiple contact vias extending through the second dielectric layer to land on the frame portion of the mesh metal feature. This patent highlights his innovative approach to enhancing semiconductor testing processes. He has 1 patent to his name.

Career Highlights

Lee-Wen Hsu is currently employed at Taiwan Semiconductor Manufacturing Company Limited, a leading firm in the semiconductor industry. His role at the company allows him to work on cutting-edge technologies and contribute to advancements in semiconductor manufacturing.

Collaborations

Throughout his career, Lee-Wen Hsu has collaborated with notable colleagues, including Chih-Pin Chiu and Zhen De Ma. These collaborations have fostered an environment of innovation and have led to the development of new technologies in the semiconductor field.

Conclusion

Lee-Wen Hsu is a distinguished inventor whose work in wafer test pad technology has made a significant impact in the semiconductor industry. His innovative patent reflects his dedication to advancing technology and improving testing processes.