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For the Inventor, By the Inventor

Owego, NY, United States of America

Lawrence E Albertelli

USPTO Granted Patents = 10

Average Co-Inventor Count = 1.8

ph-index = 5

Forward Citations = 195(Granted Patents)


Company Filing History:

goldMedal10 out of 5,267 
 
Lockheed Martin Corporation
 patents

Years Active: 2002-2008

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10 patents (USPTO):Explore Patents
1. 7406196 - Methods and systems for automatic detection of corners of a region (2008-07-29),
2. 7304663 - Image test target for visual determination of digital image resolution (2007-12-04),
3. 7236643 - System and method for filtering and binarization of images in the presence of specular noise (2007-06-26),
4. 7068856 - Method and system for determining and correcting image orientation angle (2006-06-27),
5. 7058240 - Adaptive system and method for pattern classification (2006-06-06),
6. 7051937 - System and method for fast binarization of bar codes in the presence of noise (2006-05-30),
7. 6992696 - Image test target for visual determination of digital image resolution (2006-01-31),
8. 6980249 - Wide-field extended-depth doubly telecentric catadioptric optical system for digital imaging (2005-12-27),
9. 6898314 - Grayscale image connected components segmentation (2005-05-24),
10. 6484066 - Image life tunnel scanner inspection system using extended depth of field technology (2002-11-19),

Title: Innovations of Lawrence E. Albertelli

Introduction

Lawrence E. Albertelli is a notable inventor based in Owego, NY (US). He has made significant contributions to the field of imaging technology, holding a total of 10 patents. His work focuses on methods and systems that enhance the accuracy and efficiency of image capture and analysis.

Latest Patents

Among his latest patents are two innovative technologies. The first is a method and system for automatic detection of corners of a region in an image. This invention streamlines the process of identifying key features within images, which is crucial for various applications in imaging technology. The second patent is an image test target for visual determination of digital image resolution. This system allows for the measurement of an imaging system's resolution by utilizing a test target with a progression of feature sizes. The captured images are then analyzed to ensure they do not exhibit aliasing, such as Moire patterns. This technology enables quick and precise resolution determination using a cost-effective test target.

Career Highlights

Lawrence E. Albertelli is currently employed at Lockheed Martin Corporation, where he continues to innovate and develop new technologies. His work at this prestigious company has allowed him to contribute to advancements in imaging systems that are vital for various industries.

Collaborations

Throughout his career, Albertelli has collaborated with talented individuals such as Nina Kung and David L. Ii. These partnerships have foster

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