The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 31, 2006
Filed:
Oct. 26, 2000
Lawrence E. Albertelli, Owego, NY (US);
Lawrence E. Albertelli, Owego, NY (US);
Lockheed Martin Corporation, Bethesda, MD (US);
Abstract
Resolution of an image capture system is measured by imaging a test target having a progression of feature sizes and pitch in respective sub-fields thereof. The image captured by the imaging system is then inspected to determine a sub-field image which does not include aliasing in the form of a Moire' pattern. Inclusion of reference numerals corresponding to the sub-field image feature size and pitch allows direct reading of the resolution of the imaging system. Such a system enables fast and accurate determination of the resolution and alignment of an imaging system using an inexpensively produced test target together with an arbitrary image viewing program.