The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 24, 2005

Filed:

Dec. 26, 2001
Applicants:

Nina Kung, Owego, NY (US);

Lawrence E. Albertelli, Owego, NY (US);

David L. Ii, Owego, NY (US);

Inventors:

Nina Kung, Owego, NY (US);

Lawrence E. Albertelli, Owego, NY (US);

David L. Ii, Owego, NY (US);

Assignee:

Lockheed Martin Corporation, Bethesda, MD (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K009/34 ;
U.S. Cl.
CPC ...
Abstract

A method and system of reading images. The method includes decimating an image and normalizing the decimated image. Then, rebinning grayscale pixel data associated with the decimated image and reassigning a selected range of grayscales representing a region of interest of the remapped grayscale pixel data to one while zeroing others. The method also includes labeling the connected pixels associated with the range of grayscales representing the region of interest and then extending the connected pixels through region growing using a preselected offset value. Lastly, the method includes filtering segmented regions of the connected pixels to eliminate certain candidates. The system is designed to implement the steps of the enumerated method.


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