Yorktown Heights, NY, United States of America

Lawrence D Thorp

This inventor holds 4 USPTO granted patents. Top assignee: International Business Machines Corporation. Active years: 1977-1993.


% Patents Active = 100.0

Average Co-Inventor Count = 4.9

ph-index = 4

Forward Citations = 108(Granted Patents)


Location History:

  • Yorktown, NY (US) (1977)
  • Yorktown Heights, NY (US) (1992 - 1993)

Company Filing History:


Years Active: 1977-1993

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4 patents (USPTO):Explore Patents

Title: Innovations by Lawrence D Thorp

Introduction

Lawrence D Thorp is a notable inventor based in Yorktown Heights, NY (US). He has made significant contributions to the field of object inspection technology. With a total of 4 patents to his name, Thorp's work has advanced the methods used to detect surface level defects in various materials.

Latest Patents

Thorp's latest patents include a method and apparatus for object inspection. This innovative technology involves positioning the object to be inspected and utilizing polarized laser light reflected off a rotated polygon mirror. The light is directed over the area of interest, and multiple fiber optic bundles are employed to capture the reflected light. Photomultipliers convert this light into electrical signals, which are then digitized by associated electronics. By tracking pixel edge boundaries and assessing whether certain thresholds are exceeded, the technology can identify a variety of defects. The defects are then categorized by comparing them to a reference base.

Another significant patent is the Advanced via inspection tool (AVIT), which shares similar principles with the previous invention. This method also focuses on the inspection and handling of surface level defects, utilizing the same laser and fiber optic technology to ensure accurate detection and categorization of defects.

Career Highlights

Lawrence D Thorp is currently employed at International Business Machines Corporation (IBM), where he continues to innovate and develop new technologies. His work has been instrumental in enhancing inspection processes across various industries.

Collaborations

Thorp has collaborated with notable coworkers, including Stephen J Kish and Douglas Y Kim. Their combined expertise has contributed to the successful development of advanced inspection technologies.

Conclusion

Lawrence D Thorp's contributions to the field of object inspection have paved the way for more efficient and accurate defect detection methods. His innovative patents reflect a commitment to advancing technology in this critical area.

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