Lavi Jacov Shachar

Title: Lavi Jacov Shachar: Innovator in Overlay Monitoring Technology

Introduction

Lavi Jacov Shachar is a prominent inventor based in Tel Aviv, Israel. He has made significant contributions to the field of technology, particularly in overlay monitoring and image registration for multi-layer objects. With a total of five patents to his name, Shachar continues to push the boundaries of innovation in his industry.

Latest Patents

Shachar's latest patents include a method for overlay monitoring that involves obtaining secondary and backscattered electron images of a substrate. This method allows for the determination of locations of structural elements and the calculation of overlay errors. Another notable patent focuses on registering between an image and a description of a multi-layer object. This invention utilizes a memory for storing images and descriptions, along with a processor to match descriptions to specific parts of the image, ensuring accurate registration.

Career Highlights

Lavi Jacov Shachar is currently employed at Applied Materials Israel Limited, where he applies his expertise in developing advanced technologies. His work has been instrumental in enhancing the precision of imaging techniques used in various applications.

Collaborations

Shachar collaborates with talented individuals such as Shaul Cohen and Amit Batikoff, contributing to a dynamic work environment that fosters innovation and creativity.

Conclusion

Lavi Jacov Shachar is a distinguished inventor whose work in overlay monitoring and image registration has made a significant impact in the field of technology. His contributions continue to inspire advancements in the industry.