The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 25, 2020
Filed:
Nov. 02, 2018
Applied Materials Israel Ltd., Rehovot, IL;
Ron Katzir, Tel Aviv, IL;
Imry Kissos, Kiryat-Ono, IL;
Lavi Shachar, Tel Aviv, IL;
Amit Batikoff, Petach Tikva, IL;
Shaul Cohen, Irus, IL;
Noam Zac, Kfar Saba, IL;
Applied Materials Israel Ltd., Rehovot, IL;
Abstract
One or more metrology objects and one or more metrology operations may be identified. A design-based representation of a first metrology object of the one or more metrology objects may be received. Furthermore, an image-based representation of the first metrology object of the one or more metrology objects may be received where the one or more metrology operations include a first metrology operation associated with the first metrology object that is to be performed on the image-based representation of the first metrology object. The design-based representation of the first metrology object may be mapped with the image-based representation of the first metrology object. The first metrology operation may be performed based on the mapping.