Boulder, CO, United States of America

Lauren E Lang

USPTO Granted Patents = 2 

Average Co-Inventor Count = 8.0

ph-index = 1


Company Filing History:


Years Active: 2025

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2 patents (USPTO):Explore Patents

Title: The Innovative Contributions of Lauren E. Lang

Introduction

Lauren E. Lang is a prominent inventor based in Boulder, Colorado. She has made significant strides in the field of resistance tomography, showcasing her expertise through her innovative patent. Her work is characterized by a commitment to enhancing imaging resolution, which has important implications in various scientific and engineering applications.

Latest Patents

Lauren holds a patent for a method titled "High resolution two-dimensional resistance tomography." This invention improves tomographic resistance image resolution by adopting an orthogonal basis with the maximum number of elements N. This basis is designed to describe the maximum resolution resistivity map ρ(r), where the number of elements N is determined by the number of electrodes Q. The method enhances resolution by defining the orthogonal basis according to known constraints, positioning electrodes to be sensitive to these basis functions, and selecting current I and voltage V contact electrode pairs that maximize the signal-to-noise ratio.

Career Highlights

Lauren E. Lang is affiliated with Northwestern University, where she contributes to research and development in her field. Her innovative approach to resistance tomography has positioned her as a key figure in advancing imaging technologies. With a focus on practical applications, her work continues to influence the landscape of resistance imaging.

Collaborations

Lauren collaborates with notable colleagues, including Matthew Grayson and Chulin Wang. Their combined expertise fosters a dynamic research environment that encourages innovation and the development of cutting-edge technologies.

Conclusion

Lauren E. Lang's contributions to the field of resistance tomography exemplify her dedication to innovation and excellence. Her patent reflects a significant advancement in imaging technology, and her collaborations further enhance the impact of her work.

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