The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 15, 2025

Filed:

Nov. 29, 2019
Applicant:

Northwestern University, Evanston, IL (US);

Inventors:

Matthew Allen Grayson, Evanston, IL (US);

Chulin Wang, Evanston, IL (US);

Claire Cecelia Onsager, Stoughton, WI (US);

Can Cenap Aygen, Chicago, IL (US);

Charles M. Costakis, Evanston, IL (US);

Lauren E. Lang, Boulder, CO (US);

Andreas Tzavelis, Demarest, NJ (US);

John Ashley Rogers, Wilmette, IL (US);

Assignee:

Northwestern University, Evanston, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/0536 (2021.01);
U.S. Cl.
CPC ...
A61B 5/0536 (2013.01);
Abstract

The disclosed 2-D and 3-D tomographic resistance imaging method improves tomographic resistance image resolution by adopting an orthogonal basis with the maximum number of elements N to describe the maximum resolution resistivity map ρ(r), where this number of elements N is set according to the number of electrodes Q; by defining the orthogonal basis according to any known constraints in the problem, thereby enhancing the resolution where it is needed; by positioning electrodes to be sensitive to these basis functions; and by choosing current I and voltage V contact electrode pairs that maximize signal-to-noise ratio.


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