Company Filing History:
Years Active: 1999-2005
Title: Laura Pressley: Innovator in Semiconductor Technology
Introduction
Laura Pressley is a prominent inventor based in Austin, TX, known for her significant contributions to semiconductor technology. With a total of 4 patents, she has developed innovative methods that enhance the detection of defects in semiconductor devices. Her work has been instrumental in advancing the field and improving manufacturing processes.
Latest Patents
One of her latest patents is titled "Method, system and apparatus to detect defects in semiconductor devices." This invention presents a method and system to locate and detect voids in films involved in critical dimension structures and non-critical dimension structures in semiconductor devices. The process utilizes a scanning electron microscope operated in voltage contrast mode to obtain a digital representation of the test structure. The automated system analyzes the voltage contrast image, allowing for the sensitive identification and categorization of voids, which is crucial for inline monitoring during manufacturing.
Another notable patent is the "Method of detecting crystalline defects using sound waves." This method involves determining the natural frequency of a circuit structure immersed in a liquid. By sending sonic pulses through the liquid, the method facilitates the early identification of structural defects, enhancing the reliability of circuit structures.
Career Highlights
Laura Pressley has worked with leading companies in the semiconductor industry, including Advanced Micro Devices Corporation and Motorola Corporation. Her experience in these organizations has contributed to her expertise and innovative approach to problem-solving in semiconductor technology.
Collaborations
Throughout her career, Laura has collaborated with notable professionals, including Terri A Couteau and Michael J Satterfield. These collaborations have further enriched her work and expanded her impact in the field.
Conclusion
Laura Pressley is a trailblazer in semiconductor technology, with a focus on defect detection methods that enhance manufacturing processes. Her innovative patents and career achievements reflect her dedication to advancing the industry.