Lake Forest, CA, United States of America

Larry Tucholski

This inventor holds 2 USPTO granted patents. Top assignee: Scantron Corporation. Active years: 2006-2007.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Larry Tucholski. Retrieved from https://idiyas.com/inventor/larry-tucholski

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 2

Forward Citations = 18(Granted Patents)


Company Filing History:


Years Active: 2006-2007

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2 patents (USPTO):Explore Patents

Title: Larry Tucholski: Innovator in Scannable Form Technology

Introduction

Larry Tucholski is a notable inventor based in Lake Forest, CA (US). He has made significant contributions to the field of scannable form technology. With a total of 2 patents to his name, Tucholski continues to push the boundaries of innovation.

Latest Patents

One of his latest patents is a scannable form and system. This invention features a numeric value block, a plurality of response control marks, response receiving rows, and a zone for a bar code, optical character recognition (OCR) spaces, and/or intelligence character recognition (ICR) spaces. The scannable form is designed to be scanned by two different devices, enhancing its versatility and usability.

Career Highlights

Larry Tucholski is currently employed at Scantron Corporation, where he applies his expertise in developing innovative scanning solutions. His work has significantly impacted the efficiency of data collection and processing.

Collaborations

Tucholski collaborates with various professionals in his field, including his coworker Jacky L McIntosh. Their combined efforts contribute to the advancement of technology in scannable forms.

Conclusion

Larry Tucholski is a pioneering inventor whose work in scannable form technology continues to influence the industry. His innovative patents and collaborations reflect his commitment to enhancing data processing solutions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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