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USPTO Data Jan 1 1976 - Nov 3 2026
9 Patents
#17 in Eagan, MN
#944 in Minnesota
#32,651 in US
Scantron Corporation
Forward Citations = 142
17 inventors:
Eagan, MN, United States of America
Scantron Corporation
Calculating rank
% Expired Patents = 11.1
Trademarks = 14
Forward Citations = 142
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17 inventors (with patents filed for the assignee):
Joe Zajac (2 out of 2 patents)
Jonathan Ort (2 out of 2 patents)
Todd Nelson Radtke (2 out of 2 patents)
4. Hugh Eugene Watson (2 out of 8 patents)
5. Jacky L McIntosh (2 out of 2 patents)
6. Larry Tucholski (2 out of 2 patents)
7. Robbie Allen Nielsen (1 out of 7 patents)
8. Shawn Hunter (1 out of 1 patent)
9. Steve Olson (1 out of 1 patent)
10. Bill Kantos (1 out of 1 patent)
11. Alan Stoddard (1 out of 1 patent)
12. Jason Lee Sprenger (1 out of 1 patent)
13. Philip R Moulton (1 out of 1 patent)
14. Craig Emmerich (1 out of 1 patent)
15. Michael Prutz (1 out of 1 patent)
9 patents:
Company Overview
Scantron Corporation is a leading provider of assessment and technology solutions for education, commercial, and government organizations. With a history dating back over four decades, Scantron's comprehensive range of products and services help customers capture, analyze, and use data to improve outcomes and drive success. From test scoring and survey management to data analytics and technology integration, Scantron specializes in providing innovative solutions that empower organizations to make informed decisions and achieve their goals.
Profile summary synthesized from public USPTO records and patent filings.
IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Scantron Corporation. Retrieved from https://idiyas.com/company/scantron
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]