Larry Ray Fenstermaker

Title: Larry Ray Fenstermaker: Innovator in Memory Testing Technologies

Introduction

Larry Ray Fenstermaker is a notable inventor based in Nazareth, PA (US). He has made significant contributions to the field of memory testing technologies, holding a total of 3 patents. His work has been instrumental in advancing the reliability and functionality of memory devices.

Latest Patents

Fenstermaker's latest patents include a "Method and system for testing multiport memories." This invention involves a memory device with first and second sets of memory cells, where a data generating function creates patterns to test the memory's integrity. The controller manages the writing and reading processes to ensure that the data matches expected patterns, allowing for fault detection in the memory device.

Another significant patent is the "Method for built-in self-testing of ring-address FIFOs having a data." This dual-port RAM-type ring-address FIFO is tested through a series of interwoven steps that reveal all possible memory, address, and functional faults. The method alters the state of various flags and the logic state of the data produced by the FIFO, ensuring comprehensive testing.

Career Highlights

Throughout his career, Fenstermaker has worked with several prominent companies, including Agere Systems, Guardian Corporation, and AT&T Bell Laboratories. His experience in these organizations has contributed to his expertise in memory technologies and testing methods.

Collaborations

Fenstermaker has collaborated with notable coworkers such as Ilyoung Kim and Frank P. Higgins. Their combined efforts have furthered advancements in the field of memory testing and technology.

Conclusion

Larry Ray Fenstermaker's innovative contributions to memory testing technologies have established him as a key figure in the industry. His patents reflect a deep understanding of memory devices and their testing requirements, ensuring enhanced reliability in modern technology.