Loveland, CO, United States of America

Larry G Smeins

This inventor holds 1 USPTO granted patent. Top assignee: Hewlett-Packard Company. Active years: 1989.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Larry G Smeins. Retrieved from https://idiyas.com/inventor/larry-g-smeins

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 1989

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1 patent (USPTO):Explore Patents

Title: Larry G. Smeins: Innovator in In-Circuit Testing Technology

Introduction

Larry G. Smeins is a notable inventor based in Loveland, Colorado. He has made significant contributions to the field of electronics, particularly in the area of in-circuit testing. His innovative approach has led to the development of a unique device that enhances the functionality verification of operational amplifiers.

Latest Patents

Larry G. Smeins holds a patent for a device titled "Programmatically generated in-circuit test for general purpose." This invention provides a process for programmatically generated and controlled in-circuit pin tests and gross functionality tests of operational amplifiers. The tests ensure basic functionality verification of amplifier functions, independent of other circuitry on the printed circuit board of which the operational amplifier is a component. He has 1 patent to his name.

Career Highlights

Larry is currently employed at Hewlett-Packard Company, where he continues to innovate and contribute to advancements in technology. His work has been instrumental in improving testing processes within the electronics industry.

Collaborations

Larry has collaborated with Wayne R. Chism, a fellow innovator, to further enhance the development of testing technologies. Their combined expertise has led to significant advancements in the field.

Conclusion

Larry G. Smeins is a distinguished inventor whose work in in-circuit testing technology has made a lasting impact on the electronics industry. His innovative solutions continue to pave the way for future advancements in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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