The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 10, 1989
Filed:
Mar. 31, 1988
Applicant:
Inventors:
Wayne R Chism, Greeley, CO (US);
Larry G Smeins, Loveland, CO (US);
Assignee:
Hewlett-Packard Company, Palo Alto, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
330-2 ; 324 / ;
Abstract
A device and process for programmatically generated and controlled in-circuit pin tests and gross functionality tests of operational amplifiers. The tests provide basic functionality verification of amplifier functions independent of other circuitry on the printed circuit board of which the operational amplifier is a component.
Chism, Wayne. (1989). Programmatically generated in-circuit test for general purpose (U.S. Patent No. 4797627). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4797627
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile