Company Filing History:
Years Active: 2017-2019
Title: Larry Dworkin: Innovator in TEM Sample Preparation
Introduction
Larry Dworkin is a notable inventor based in Portland, OR (US). He has made significant contributions to the field of transmission electron microscopy (TEM) sample preparation. With a total of 2 patents, Dworkin's work has advanced the methodologies used in this critical area of research.
Latest Patents
Dworkin's latest patents include innovative methods for high throughput TEM preparation processes and hardware for backside thinning of cross-sectional view lamella. This method allows for TEM sample preparation and analysis to be conducted in a focused ion beam-scanning electron microscope (FIB-SEM) system without the need for re-welds, unloads, or user handling of the lamella. The process enables a dual beam FIB-SEM system with a typical tilt stage to extract a sample from a substrate, mount it onto a TEM sample holder capable of tilting, thin the sample using FIB milling, and rotate the sample so that the face is perpendicular to an electron column for scanning transmission electron microscopy (STEM) imaging.
Career Highlights
Larry Dworkin is currently employed at FEI Company, where he continues to push the boundaries of electron microscopy technology. His work has been instrumental in enhancing the efficiency and effectiveness of sample preparation techniques.
Collaborations
Dworkin collaborates with talented individuals such as Paul Keady and Brennan Peterson, contributing to a dynamic and innovative work environment.
Conclusion
Larry Dworkin's contributions to TEM sample preparation have established him as a key figure in the field. His innovative patents and collaborative efforts continue to influence advancements in electron microscopy technology.