This inventor holds 6 USPTO granted patents and 2 published patent applications. Top assignees: Michigan State University, US Government as Represented by the Secretary of the Army. Active years: 2008-2021.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:


Years Active: 2008-2021
Title: Lalita Udpa: Innovator in Nondestructive Imaging Technologies
Introduction
Lalita Udpa is a prominent inventor based in Okemos, MI (US), known for her significant contributions to the field of nondestructive imaging technologies. With a total of 6 patents, she has developed innovative solutions that enhance the detection of defects in various materials.
Latest Patents
Among her latest patents is the "Nondestructive imaging using a split-ring resonator sensing apparatus." This invention features a defect sensing apparatus designed to identify defects or targets in materials. It includes a reference split-ring resonator coupled to a microstrip, with a first sensing split-ring resonator located on the sensing side of the microstrip. Another notable patent is the "Defect detection system using finite element optimization and mesh analysis." This system employs dedicated, simultaneously operating finite element optimization and mesh generation to detect and model surface and sub-surface defects using an Eddy-current based probe.
Career Highlights
Lalita Udpa has had a distinguished career, working with esteemed organizations such as Michigan State University and the U.S. Government as represented by the Secretary of the Army. Her work has significantly advanced the field of nondestructive testing and imaging.
Collaborations
Throughout her career, she has collaborated with notable colleagues, including Satish Udpa and Chaofeng Ye, contributing to various research projects and innovations.
Conclusion
Lalita Udpa's innovative work in nondestructive imaging technologies has made a lasting impact on the field, showcasing her expertise and dedication to advancing material defect detection methods.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile