The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 16, 2021
Filed:
May. 20, 2016
Board of Trustees of Michigan State University, East Lansing, MI (US);
Secretary of the Army, Washington, DC (US);
S. Ratnajeevan H. Hoole, Okemos, MI (US);
Sivamayam Sivasuthan, East Lansing, MI (US);
Victor Uthayakumar Karthik, East Lansing, MI (US);
Paramsothy Jayakumar, Warren, MI (US);
Ravi S. Thyagarajan, Novi, MI (US);
Lalita Udpa, Okemos, MI (US);
Arunasalam Rahunanthan, Centerville, OH (US);
BOARD OF TRUSTEES OF MICHIGAN STATE UNIVERSITY, East Lansing, MI (US);
SECRETARY OF THE ARMY, Washington, DC (US);
Abstract
A defect detection system uses dedicated, simultaneously operating finite element optimization and mesh generation. Using an Eddy-current based probe, the system can detect and model surface and sub-surface defects.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile