Centerville, OH, United States of America

Arunasalam Rahunanthan

This inventor holds 1 USPTO granted patent. Top assignees: Michigan State University, US Government as Represented by the Secretary of the Army. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Arunasalam Rahunanthan. Retrieved from https://idiyas.com/inventor/arunasalam-rahunanthan

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Arunasalam Rahunanthan: Innovator in Defect Detection Systems

Introduction

Arunasalam Rahunanthan is a notable inventor based in Centerville, OH (US). He has made significant contributions to the field of defect detection through his innovative patent. His work focuses on utilizing advanced technologies to enhance the accuracy and efficiency of defect detection systems.

Latest Patents

Rahunanthan holds a patent for a "Defect detection system using finite element optimization and mesh analysis." This system employs dedicated, simultaneously operating finite element optimization and mesh generation. By utilizing an Eddy-current based probe, the system is capable of detecting and modeling both surface and sub-surface defects. This innovation represents a significant advancement in the field of defect detection.

Career Highlights

Throughout his career, Rahunanthan has worked with esteemed organizations, including Michigan State University and the U.S. Government as represented by the Secretary of the Army. His experience in these institutions has allowed him to develop and refine his expertise in defect detection technologies.

Collaborations

Some of his notable coworkers include S Ratnajeevan H Hoole and Sivamayam Sivasuthan. Their collaborative efforts have contributed to the advancement of research and development in the field.

Conclusion

Arunasalam Rahunanthan's innovative work in defect detection systems showcases his commitment to advancing technology in this critical area. His contributions have the potential to significantly impact various industries by improving defect detection methodologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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