This inventor holds 1 USPTO granted patent. Top assignee: Nanjing University. Active years: 2018.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2018
Title: Innovations of Lai Wei in Fast Scanning Calorimetry
Introduction
Lai Wei is a notable inventor based in Jiangsu, China. He has made significant contributions to the field of calorimetry, particularly through his innovative designs that enhance the integration of calorimetric techniques with microscopic structure characterization.
Latest Patents
Lai Wei holds a patent for a cooling-heating stage-type fast scanning calorimeter. This device is capable of being integrated with other microscopic structure characterization techniques. The calorimeter features a sample chamber equipped with light transmission and reflection transparent windows, a cooling-heating stage with internal heating elements and coolant channels for precise temperature control, and a fast calorimetric system. The design allows for in-situ integration of calorimetry and microscopic structure characterization, achieving dynamic compensation of sample temperature disturbances caused by incident light. This innovation facilitates precise isothermal research, showcasing Lai Wei's commitment to advancing scientific methodologies.
Career Highlights
Lai Wei is affiliated with Nanjing University, where he continues to contribute to research and development in his field. His work has garnered attention for its practical applications and innovative approach to calorimetry.
Collaborations
Lai Wei collaborates with esteemed colleagues, including Dongshan Zhou and Jing Jiang, who contribute to the research environment at Nanjing University.
Conclusion
Lai Wei's contributions to fast scanning calorimetry exemplify the intersection of innovation and practical application in scientific research. His work not only advances the field but also enhances the capabilities of researchers in various disciplines.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
