The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 28, 2018

Filed:

Dec. 20, 2013
Applicant:

Nanjing University, Nanjing, Jiangsu, CN;

Inventors:

Dongshan Zhou, Jiangsu, CN;

Lai Wei, Jiangsu, CN;

Jing Jiang, Jiangsu, CN;

Qi Xue, Jiangsu, CN;

Wei Chen, Jiangsu, CN;

Xiaoliang Wang, Jiangsu, CN;

Wei Jiang, Jiangsu, CN;

Christoph Schick, Jiangsu, CN;

Assignee:

Nanjing University, Nanjing, Jiangsu, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01K 17/00 (2006.01); G01N 25/20 (2006.01);
U.S. Cl.
CPC ...
G01K 17/006 (2013.01); G01N 25/20 (2013.01);
Abstract

A cooling-heating stage-type fast scanning calorimeter capable of being integrated with other microscopic structure characterization techniques. The cooling-heating stage-type fast scanning calorimeter includes a sample chamber provided with light transmission and reflection transparent windows on the walls thereof, a cooling-heating stage provided with internal heating elements and coolant channels for temperature control and also provided with a transmission hole, a sample chamber temperature control system and a fast calorimetric system. The cooling-heating stage-type fast scanning calorimeter has the advantages that the fast calorimetric system with heating/cooling rates is miniaturized into the cooling-heating stage, and reflection and transmission windows as well as the transmission hole of the cooling-heating stage are used for in-situ integration of calorimetry and microscopic structure characterization; and through program-controlled rapid response, dynamic compensation of sample temperature disturbances caused by incident light in structure measurement is achieved, and sample temperature is stabilized, thus facilitating precise isothermal research.


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