L Dolan Roman

Title: L Dolan Roman: Innovator in Semiconductor Measurement Technology

Introduction

L Dolan Roman is a notable inventor based in Nashua, NH (US). He has made significant contributions to the field of semiconductor technology, particularly in the measurement of electrical resistivity. His innovative approach has led to the development of advanced apparatuses that enhance the efficiency and accuracy of semiconductor testing.

Latest Patents

L Dolan Roman holds a patent for an "Apparatus for automatically measuring the resistivity of semiconductor boules by using the method of four probes." This apparatus is designed for the automated measurement and recording of the electrical resistivity of semiconductor boules or ingots. It utilizes a four-point boule support grid positioned adjacent to a four-tip probe, which is equipped with three-axis linear mobility and rotational capability. The system is computer-controlled, allowing for automated mapping and testing of semiconductor boules, whether they are "as grown" or ground with cropped ends. This innovation is crucial for obtaining and recording precise resistivity data.

Career Highlights

L Dolan Roman is associated with G.T. Equipment Technologies, Inc., where he applies his expertise in semiconductor technology. His work has been instrumental in advancing the methods used for semiconductor testing and measurement.

Collaborations

L Dolan Roman has collaborated with notable colleagues, including Mohan Chandra and Carl Chartier. Their combined efforts contribute to the ongoing development of innovative technologies in the semiconductor industry.

Conclusion

L Dolan Roman's contributions to semiconductor measurement technology exemplify the impact of innovation in this critical field. His patented apparatus represents a significant advancement in the automated testing of semiconductor materials, showcasing his dedication to enhancing technological capabilities.