This inventor holds 1 USPTO granted patent and 5 published patent applications and 1 EPO patent. Top assignee: Samsung Electronics Co., Ltd.. Active years: 2023.
Company Filing History:
Years Active: 2023
Title: Kyubaik Chang: Innovator in Defect Detection Technology
Introduction
Kyubaik Chang is a notable inventor based in Seoul, South Korea. He has made significant contributions to the field of defect detection technology, particularly in the context of substrates. His innovative approach has led to the development of a patented method that enhances the accuracy of defect detection.
Latest Patents
Kyubaik Chang holds a patent for a "Method and apparatus for detecting defects on substrate." This patent describes a comprehensive method for identifying defects on a substrate by utilizing image processing techniques. The process involves receiving a first image, converting it to grayscale levels, and calculating various gray level values. The method further includes generating images that detect edges using a Canny algorithm, thereby improving the detection of defects.
Career Highlights
Chang is currently employed at Samsung Electronics Co., Ltd., where he applies his expertise in image processing and defect detection. His work at Samsung has positioned him as a key player in advancing technology that ensures the quality and reliability of electronic components.
Collaborations
Kyubaik Chang collaborates with talented colleagues, including Sunghee Lee and Jaeyoon Kim. Together, they contribute to innovative projects that push the boundaries of technology in their field.
Conclusion
Kyubaik Chang's contributions to defect detection technology exemplify the impact of innovation in the electronics industry. His patented methods not only enhance the quality of substrates but also reflect the collaborative spirit of his work environment.