Seoul, South Korea

Kyoung Shik Jun

This inventor holds 2 USPTO granted patents and 3 published patent applications. Top assignees: Aidentyx, Inc., Bistelligence, Inc.. Active years: 2023-2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kyoung Shik Jun. Retrieved from https://idiyas.com/inventor/kyoung-shik-jun-grqavvj9

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 2 

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2023-2025

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2 patents (USPTO):Explore Patents

Title: Kyoung Shik Jun: Innovator in Facility Monitoring Systems

Introduction

Kyoung Shik Jun is a notable inventor based in Seoul, South Korea. He has made significant contributions to the field of facility monitoring systems, holding 2 patents that showcase his innovative approach to technology.

Latest Patents

His latest patents include a method for setting a model threshold of a facility monitoring system. This exemplary embodiment discloses a method for detecting anomalies in a facility monitoring system. The method involves acquiring sensor data from each sensor, extracting feature values from the sensor data, and inputting these values into a trained neural network model. The output data is then compared with the input data to set a threshold value for detecting anomalies based on the calculated comparison result.

Career Highlights

Kyoung Shik Jun has worked with several companies, including Aidentyx, Inc. and Bistelligence, Inc. His experience in these organizations has contributed to his expertise in developing advanced monitoring systems.

Collaborations

He has collaborated with notable coworkers such as Hyuk Jun Na and Woonkyu Choi, further enhancing his innovative projects.

Conclusion

Kyoung Shik Jun's work in facility monitoring systems exemplifies his commitment to innovation and technology. His patents reflect a deep understanding of sensor data and anomaly detection, making him a valuable contributor to the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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