The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 30, 2023

Filed:

Dec. 29, 2020
Applicant:

Bistelligence, Inc., Seoul, KR;

Inventors:

Donghwan Kim, Seoul, KR;

Daeyoung Kim, Seoul, KR;

Hyuk Jun Na, Seoul, KR;

Kyoung Shik Jun, Seoul, KR;

Woonkyu Choi, Seoul, KR;

Assignee:

BISTelligence, Inc., Seoul, KR;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/02 (2006.01); G05B 23/02 (2006.01); G05B 19/418 (2006.01); G06N 3/08 (2023.01); G06F 18/214 (2023.01); G06F 8/61 (2018.01); G06N 3/088 (2023.01);
U.S. Cl.
CPC ...
G05B 23/0235 (2013.01); G05B 19/4183 (2013.01); G05B 19/4185 (2013.01); G05B 19/41885 (2013.01); G06F 18/214 (2023.01); G06N 3/08 (2013.01); G06F 8/61 (2013.01); G06N 3/088 (2013.01);
Abstract

An exemplary embodiment of the present disclosure discloses a method of setting a model threshold value for detecting an anomaly of a facility monitoring system, the method including: acquiring sensor data output from each sensor; extracting a feature value for the sensor data of each sensor; acquiring output data by inputting input data including the extracted feature value to a trained neural network model; and comparing the input data and the output data and setting a threshold value for detecting an anomaly based on a calculated comparison result value.


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