Tokyo, Japan

Kyo Ryo

This inventor holds 1 USPTO granted patent. Top assignee: Hitachi High-Tech Corporation. Active years: 2026.


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Kyo Ryo - Innovator in Semiconductor Technology

Introduction

Kyo Ryo is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of semiconductor technology, particularly in the area of position specification methods. His innovative approach has paved the way for advancements in the manufacturing and inspection processes of semiconductor wafers.

Latest Patents

Kyo Ryo holds a patent for a "Position specification method, position specification program, and inspection apparatus." This patent focuses on a method for specifying the position of a mark formed on a semiconductor wafer from an image using a computer system. The method involves several procedures, including setting a partial image region, dividing the region based on a division index, and determining the existence of a mark within the region. When a mark is detected, the method calculates its representative position, enhancing the accuracy of semiconductor inspections.

Career Highlights

Kyo Ryo is currently employed at Hitachi High-Tech Corporation, where he continues to develop innovative solutions in semiconductor technology. His work has been instrumental in improving the efficiency and reliability of semiconductor manufacturing processes. With a focus on precision and accuracy, Ryo's contributions have been recognized within the industry.

Collaborations

Kyo Ryo collaborates with talented colleagues, including Liang Li and Kosuke Matsumoto. Together, they work on various projects aimed at advancing semiconductor technology and improving inspection methodologies.

Conclusion

Kyo Ryo's innovative work in semiconductor technology exemplifies the impact of dedicated inventors in the field. His patent and ongoing contributions continue to shape the future of semiconductor manufacturing and inspection processes.

Profile summary based on public USPTO records.
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