Changhua, Taiwan

Kwun-Goo Hung

This inventor holds 1 USPTO granted patent. Top assignee: Taiwan Semiconductor Manufacturing Comp. Ltd.. Active years: 2004.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kwun-Goo Hung. Retrieved from https://idiyas.com/inventor/kwun-goo-hung

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 25(Granted Patents)


Company Filing History:


Years Active: 2004

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1 patent (USPTO):Explore Patents

Title: Kwun-Goo Hung: Innovator in Wafer Calibration Technology

Introduction: Kwun-Goo Hung is a notable inventor based in Changhua, Taiwan. He has made significant contributions to the field of semiconductor manufacturing, particularly in the calibration of wafer edge gripping end effectors. His innovative methods enhance the precision and efficiency of semiconductor production processes.

Latest Patents: Kwun-Goo Hung holds a patent for a "Method of calibrating a wafer edge gripping end effector." This method involves using a wafer calibration tool held in a stationary position to simulate the position of a semiconductor wafer. The process includes engaging clamp structures on the end effector with notches formed in the calibration tool, allowing for precise data storage regarding the robot arm's location.

Career Highlights: Hung's career is marked by his work at Taiwan Semiconductor Manufacturing Company Limited, where he has applied his expertise in robotics and automation. His innovative approach to wafer calibration has contributed to advancements in semiconductor technology.

Collaborations: Some of his notable coworkers include Ko-Chin Chung and Fan-Lin Lu, who have collaborated with him on various projects within the semiconductor industry.

Conclusion: Kwun-Goo Hung's contributions to wafer calibration technology exemplify the importance of innovation in the semiconductor manufacturing sector. His work continues to influence the efficiency and accuracy of production processes in this critical industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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